Nanocharacterisation -- Contents -- CHAPTER 1 Characterisation of Nanomaterials Using Transmission Electron Microscopy -- 1.1 Introduction -- 1.2 Imaging -- 1.2.1 Transmission Electron Microscopy -- 1.2.2 High-Resolution Electron Microscopy -- 1.2.3 Basis of High-Resolution Imaging -- 1.2.4 Resolution Limits -- 1.2.5 Lattice Imaging or Atomic Imaging -- 1.2.6 Instrumental Parameters -- 1.3 Survey of Applications -- 1.3.1 Developments in HREM -- 1.3.2 Small Particles and Precipitates -- 1.3.3 Two-Dimensional Objects -- 1.3.4 One-Dimensional Objects -- 1.3.5 Zero-Dimensional Objects -- 1.3.6 Surfaces and Interfaces -- 1.4 Emerging Trends and Practical Concerns -- 1.4.1 Atomic Location and Quantitative Imaging -- 1.4.2 Detection and Correction of Aberrations -- 1.4.3 The Stobbs' Factor -- 1.4.4 Radiation Damage -- 1.5 Prospects -- Acknowledgments -- References -- CHAPTER 2 Scanning Transmission Electron Microscopy -- 2.1 Introduction -- 2.1.1 Basic Description -- 2.1.2 Detectors -- 2.1.3 Electron Energy-loss Spectroscopy -- 2.2 Aberration Corrected STEM -- 2.2.1 The Aberration Function -- 2.2.2 Spherical and Chromatic Aberration -- 2.2.3 Aberration Correctors -- 2.2.4 What Do We See in a STEM? -- 2.2.5 Measuring Aberrations -- 2.2.6 Phonons -- 2.2.7 Resolution -- 2.2.8 Three-Dimensional Microscopy -- 2.2.9 Channeling -- 2.3 Applications to Nanostructure Characterisation in Catalysis -- 2.3.1 Anomalous Pt-Pt Distances in Pt/alumina Catalytic Systems -- 2.3.2 La Stabilisation of Catalytic Supports -- 2.3.3 CO Oxidation by Supported Noble-Metal Nanoparticles -- 2.4 Summary and Outlook -- Acknowledgements -- References -- CHAPTER 3 Scanning Tunneling Microscopy of Surfaces and Nanostructures -- 3.1 History of the STM -- 3.2 The Tunneling Interaction and Basic Operating Principles of STM -- 3.3 Atomic-Resolution Imaging of Surface Reconstructions.

3.4 Imaging of Surface Nanostructures -- 3.5 Manipulation of Adsorbed Atoms and Molecules -- 3.6 Influence of the Surface Electronic States on STM Images -- 3.7 Tunneling Spectroscopy -- 3.8 Tip Artefacts in STM Imaging -- 3.9 Conclusions -- References -- CHAPTER 4 Electron Energy-loss Spectroscopy and Energy Dispersive X-Ray Analysis -- 4.1 What is Nanoanalysis? -- 4.2 Nanoanalysis in the Electron Microscope -- 4.2.1 General Instrumentation -- 4.3 X-Ray Analysis in the TEM -- 4.3.1 Basics of X-Ray Analysis -- 4.3.2 Analysis and Quantification of X-Ray Emission Spectra -- 4.3.3 Application to the Analysis of Nanometre Volumes in the S/TEM -- 4.3.4 Related Photon Emission Techniques in the TEM -- 4.4 Basics of EELS -- 4.4.1 Instrumentation for EELS -- 4.4.2 Basics of the EEL Spectrum -- 4.4.3 Quantification of EELS - The Determination of Chemical Composition -- 4.4.4 Determination of Electronic Structure and Bonding -- 4.4.5 Application to the Analysis of Nanometre Volumes in the S/TEM -- 4.5 EELS Imaging -- 4.6 Radiation Damage -- 4.7 Emerging Techniques -- 4.8 Conclusions -- References -- CHAPTER 5 Electron Holography of Nanostructured Materials -- 5.1 Introduction -- 5.1.1 Basis of Off-Axis Electron Holography -- 5.1.2 Experimental Considerations -- 5.2 The Mean Inner Potential Contribution to the Phase Shift -- 5.3 Measurement of Magnetic Fields -- 5.3.1 Early Experiments -- 5.3.2 Experiments Involving Digital Acquisition and Analysis -- 5.4 Measurement of Electrostatic Fields -- 5.4.1 Electrically Biased Nanowires -- 5.4.2 Dopant Potentials in Semiconductors -- 5.4.3 Space-Charge Layers at Grain Boundaries -- 5.5 High-Resolution Electron Holography -- 5.6 Alternative Forms of Electron Holography -- 5.7 Discussion, Prospects for the Future and Conclusions -- Acknowledgements -- References -- CHAPTER 6 Electron Tomography -- 6.1 Introduction.

6.2 Theory of Electron Tomography -- 6.2.1 From Projections to Reconstructions -- 6.2.2 Backprojection: Real-Space Reconstruction -- 6.2.3 Constrained Reconstructions -- 6.2.4 Reconstruction Resolution -- 6.2.5 Measuring Reconstruction Resolution -- 6.2.6 The Projection Requirement -- 6.3 Acquiring Tilt Series -- 6.3.1 Instrumental Considerations -- 6.3.2 Specimen Support and Positioning -- 6.3.3 Specimen Considerations -- 6.4 Alignment of Tilt Series -- 6.4.1 Alignment by Tracking of Fiducial Markers -- 6.4.2 Alignment by Cross-Correlation -- 6.4.3 Rotational Alignment without Fiducial Markers -- 6.4.4 Other Markerless Alignment Techniques -- 6.5 Visualisation, Segmentation and Data Mining -- 6.5.1 Visualisation Techniques -- 6.5.2 Segmentation -- 6.5.3 Quantitative Analysis -- 6.6 Imaging Modes -- 6.6.1 Bright-Field TEM -- 6.6.2 Dark-Field Tomography -- 6.6.3 HAADF STEM -- 6.6.4 Meeting the Projection Requirement -- 6.6.5 Experimental Considerations -- 6.6.6 Limitations -- 6.6.7 Core-Loss (Chemical Mapping) EFTEM -- 6.6.8 Low-Loss EFTEM -- 6.6.9 Energy Dispersive X-Ray (EDX) Mapping -- 6.6.10 Holographic Tomography -- 6.7 New Techniques -- 6.7.1 Electron Energy-Loss Spectroscopy (EELS) Spectrum Imaging -- 6.7.2 Confocal STEM -- 6.7.3 Atomistic Tomography -- 6.8 Conclusions -- References -- CHAPTER 7 In-situ EnvironmentalTransmission Electron Microscopy -- 7.1 Introduction -- 7.2 Background -- 7.3 Recent Advances in Atomic-Resolution In-Situ ETEM -- 7.4 Impact of Atomic-Resolution In-Situ ETEM and Applications -- 7.5 Applications of Atomic-Resolution In-situ ETEM to Studies of Gas-Catalyst and Liquid-Catalyst Reactions -- 7.5.1 Liquid-Phase Hydrogenation and Polymerisation Reactions -- 7.5.2 Development of Nanocatalysts for Novel Hydrogenation Chemistry and Dynamic Imaging of Desorbed Organic Products in Liquid-Phase Reactions.

7.5.3 Butane Oxidation Technology -- 7.5.4 In-Situ Observations of Carbon Nanotubes in Chemical and Thermal Environments -- 7.6 Conclusions -- Acknowledgements -- References -- Subject Index.