X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Başlık:
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Yazar:
Ossig, Christina
Yazar Ek Girişi:
Yayın Bilgileri:
Cambridge, MA MyJoVE Corp 2016
Fiziksel Tanımlama:
online resource (10 seconds)
Seri:
Engineering
Genel Not:
Title from resource description page
Özet:
A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.
Okuma Düzeyi:
For undergraduate, graduate, and professional students
Konu Başlığı:
Elektronik Erişim:
https://www.jove.com/t/60001