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1. 
Characterization of defect structure of epitaxial CdTe films için kapak resmi
Characterization of defect structure of epitaxial CdTe films
Characterization of defect structure of epitaxial CdTe films
by 
Özden, Selin, author.
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such as AFM, SEM, Nomarski Microscopy, X-ray Diffraction (XRD), Fourier Transform Infrared Spectroscopy
2. 
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry için kapak resmi
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
by 
Günnar, Merve, author.
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diffraction (XRD). The temperature dependencies of the optical properties of the material obtained by SE were
3. 
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films için kapak resmi
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
by 
Bilgilisoy, Elif, author.
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quality was also obtained by using x-ray diffraction (XRD) measurements. The thicknesses of the samples
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