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2. 
Characterization of defect structure of epitaxial CdTe films için kapak resmi
Characterization of defect structure of epitaxial CdTe films
Characterization of defect structure of epitaxial CdTe films
by 
Özden, Selin, author.
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Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). The variation of As2O3 and Ga2O3 contents
3. 
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry için kapak resmi
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
by 
Günnar, Merve, author.
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over the film surface. Characterization results were compared to those obtained by atomic force
4. 
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films için kapak resmi
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
by 
Bilgilisoy, Elif, author.
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layers were analyzed by atomic force microscopy (AFM), scanning electron microscopy (SEM) and Nomarski
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