by
Gül, Semra.
Format:
El Yazması
Alıntı:
Atomic force microscopy
by
Oğuz, Kaan.
Format:
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Alıntı:
Diffraction (XRD), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM). Ellipsometry was
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by
Özdemir, Mehtap.
Format:
El Yazması
Alıntı:
height of the mesa were investigated using atomic force microscopy. Tunneling characteristics were
by
Urkaç Sokullu, Şadiye Emel.
Format:
El Yazması
Alıntı:
), Differential Scanning Calorimetry (DSC), X-Ray Diffraction (XRD) Analysis, Atomic Force Microscopy (AFM
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