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Günel, Hacı Yusuf.
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, LaAlO3 and SrTiO3 substrates were first characterized structurally via x-ray diffraction and scanning
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Algül, Berrin Pınar.
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Diffraction.Prepared thin film samples were patterned as bicrystal grain boundary Josephson junctions by standard
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Aksak, Meral.
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as-grown CNTs were also examined by X-ray diffraction method, and the results were compared one another.
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Karşal, Çiçek.
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by melt blending method. The experimental results of X-ray diffraction (XRD) and scanning electron
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