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by
Kızıltepe, Esin, author.
Format:
El Yazması
Alıntı:
by means of Scanning Electron Microscopy (SEM) and X-Ray Diffraction (XRD). The PE and PP were
by
Özden, Selin, author.
Format:
El Yazması
Alıntı:
such as AFM, SEM, Nomarski Microscopy, X-ray Diffraction (XRD), Fourier Transform Infrared Spectroscopy
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by
Günnar, Merve, author.
Format:
El Yazması
Alıntı:
diffraction (XRD). The temperature dependencies of the optical properties of the material obtained by SE were
by
Yazıcı, Şebnem, author.
Format:
El Yazması
Alıntı:
phases, nearly pure CZTS thin films were obtained. Additionally, the intense and sharp XRD diffraction
4 sonuç bulundu
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