11 sonuç bulundu
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by
Akça, Fatime Gülşah, author.
Format:
El Yazması
Alıntı:
tubular furnace in order to obtain the CZTS compound. X-ray diffraction and Raman spectroscopy
by
Tozan, Şerife.
Format:
El Yazması
Alıntı:
) and x-ray diffraction measurements.Finally, our results were compared to literature and explanied
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by
Büyükköse, Serkan.
Format:
El Yazması
Alıntı:
diffraction, scanning electron microscopy and atomic force microscopy. Oxidation experiments were performed
by
Bıyıklı, Ozan, author.
Format:
El Yazması
Alıntı:
), X-Ray diffraction (XRD), and current-voltage measurement. Furthermore, n-i-p devices with the FTO/c-TiO2
by
Meriç, Ece, author
Format:
El Yazması
Alıntı:
X-Ray Diffraction (XRD) spectroscopies. Scanning electron microscopy (SEM) was used to investigate the
by
Yüce, Hürriyet, author.
Format:
El Yazması
Alıntı:
techniques such as Raman, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) and
by
Yazıcı, Şebnem, author.
Format:
El Yazması
Alıntı:
phases, nearly pure CZTS thin films were obtained. Additionally, the intense and sharp XRD diffraction
by
Özçeri, Elif.
Format:
El Yazması
Alıntı:
roughness, which affected the number of graphene layers, were examined by X-ray Diffraction (XRD) and Atomic
by
Ekmekçioğlu, Merve, author.
Format:
El Yazması
Alıntı:
spectroscopy (EDS), scanning electron microscopy (SEM), Xray diffraction (XRD) and Raman spectroscopy.
by
Köseoğlu, Fulya, author.
Format:
El Yazması
Alıntı:
investigated using energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), scanning electron
by
Ulusoy, Seda, author.
Format:
El Yazması
Alıntı:
, crystalline structure of the targets was characterized by X-ray powder diffraction (XRPD) and Raman
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