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Demirsar, Yelda.
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Scanning electron microscopy.
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Şenöz, Ceylan
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between the crucible and the frit was investigated by Scanning Electron Microscopy (SEM, Philips XL-30S
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Karal, Kazım
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reinforced epoxy. The worn surfaces were examined with scanning electron microscopy (SEM) and the results
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Vahaplar, Kadir
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been studied by X-Ray Diffractometer (XRD), Atomic Force Microscopy (AFM) and Scanning Electron
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Çağlar, Özlem
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studied by X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning electron microscope (SEM
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Kumral, Elif
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). Characterization of the novel sorbents were performed using scanning electron microscopy (SEM/EDS), thermo
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