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Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling

Mahapatra, Souvik. editor.

https://doi.org/10.1007/978-81-322-2508-9

Format:

Elektronik Kaynak

Alıntı:

and Materials Impact, DC and AC Modeling / Mahapatra, Souvik. editor.

Wave Dynamics of Generalized Continua

Bagdoev, Alexander G. author.

https://doi.org/10.1007/978-3-642-37267-4

Format:

Elektronik Kaynak

Alıntı:

Characterization and Evaluation of Materials.

Basic Physics of Functionalized Graphite

Esquinazi, Pablo D. editor.

https://doi.org/10.1007/978-3-319-39355-1

Format:

Elektronik Kaynak

Alıntı:

Characterization and Evaluation of Materials.

Resistivity Recovery in Fe and FeCr alloys

Gómez-Ferrer, Begoña. author.

https://doi.org/10.1007/978-3-319-38857-1

Format:

Elektronik Kaynak

Alıntı:

Metallic Materials.

Electronic Properties of Organic Conductors

Mori, Takehiko. author.

https://doi.org/10.1007/978-4-431-55264-2

Format:

Elektronik Kaynak

Alıntı:

Optical and Electronic Materials.

Hole Conductor Free Perovskite-based Solar Cells

Etgar, Lioz. author.

https://doi.org/10.1007/978-3-319-32991-8

Format:

Elektronik Kaynak

Alıntı:

Optical and Electronic Materials.

Diffusion in Ceramics

Pelleg, Joshua. author.

https://doi.org/10.1007/978-3-319-18437-1

Format:

Elektronik Kaynak

Alıntı:

Characterization and Evaluation of Materials.

$Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry için kapak resmi$

Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry

Carter, C. Barry. editor.

https://doi.org/10.1007/978-3-319-26651-0

Format:

Elektronik Kaynak

Alıntı:

Characterization and Evaluation of Materials.

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