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Üney, Sinem, author.
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Alıntı:
Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Surface Plasmon Resonance which allows to
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İncel, Anıl, author.
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drop tower system which was specficically designed for this research. Atomic force microscopy (AFM
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Seziş, Ümmügülsüm, author.
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. The surface topography was studied using atomic force microscopy (AFM). The findings show the
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Özpirin, Merve, author.
Format:
El Yazması
Alıntı:
(FTIR), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) and Contact Angle measurements
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