by
Özkendir, Dilce, author.
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Alıntı:
Atomic force microscopy.
by
Yağmurcukardeş, Nesli, author.
Format:
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Alıntı:
Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KPFM), Raman
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by
Özçeri, Elif.
Format:
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Alıntı:
Force Microscopy (AFM) techniques, respectively. The thickness and columnar structure of the films were
by
Keskin, Yasemin, author.
Format:
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Alıntı:
were done with Atomic Force Microscopy. The experimental results showed that single layer graphene on
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