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Akça, Fatime Gülşah, author.
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films were determined by scanning electron microscopy (SEM). Electrical properties were measured by van
by
Meriç, Ece, author
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X-Ray Diffraction (XRD) spectroscopies. Scanning electron microscopy (SEM) was used to investigate the
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Buldu, Dilara Gökçen, author.
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were obtained with increasing sulfurization temperature. Electron Dispersive Spectroscopy (EDS) was
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Köseoğlu, Fulya, author.
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investigated using energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), scanning electron
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