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Bakali, Emine, author.
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Scanning electron microscopy.
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Akça, Fatime Gülşah, author.
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films were determined by scanning electron microscopy (SEM). Electrical properties were measured by van
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Büyükköse, Serkan.
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diffraction, scanning electron microscopy and atomic force microscopy. Oxidation experiments were performed
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Bıyıklı, Ozan, author.
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data from characterization methods such as optical microscopy, scanning electron microscopy (SEM
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Meriç, Ece, author
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X-Ray Diffraction (XRD) spectroscopies. Scanning electron microscopy (SEM) was used to investigate the
by
Özkendir, Dilce, author.
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, Scanning Electron Microscopy and Atomic Force Microscopy measurements. The wrinkle to wrinkle spacing and
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Özçeri, Elif.
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measured from Surface Profiler and Scanning Electron Microscopy (SEM) images. Ni films were annealed at 800
by
Ekmekçioğlu, Merve, author.
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spectroscopy (EDS), scanning electron microscopy (SEM), Xray diffraction (XRD) and Raman spectroscopy.
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Köseoğlu, Fulya, author.
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investigated using energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), scanning electron
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