by
Bakali, Emine, author.
Format:
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Alıntı:
Atomic force microscopy.
by
Günnar, Merve, author.
Format:
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Alıntı:
over the film surface. Characterization results were compared to those obtained by atomic force
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by
Bilgilisoy, Elif, author.
Format:
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Alıntı:
layers were analyzed by atomic force microscopy (AFM), scanning electron microscopy (SEM) and Nomarski
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