by
Vahaplar, Kadir
Format:
El Yazması
Alıntı:
been studied by X-Ray Diffractometer (XRD), Atomic Force Microscopy (AFM) and Scanning Electron
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by
Çağlar, Özlem
Format:
El Yazması
Alıntı:
studied by X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning electron microscope (SEM
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