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1. 
Analysis of cantilevers for high-speed atomic force microscopy için kapak resmi
Analysis of cantilevers for high-speed atomic force microscopy
Analysis of cantilevers for high-speed atomic force microscopy
by 
Brar, Harpreet Singh, author.
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Analysis of cantilevers for high-speed atomic force microscopy / Brar, Harpreet Singh, author.
3. 
Nanotribological properties of graphene grown on silicon carbide semiconductor için kapak resmi
Nanotribological properties of graphene grown on silicon carbide semiconductor
Nanotribological properties of graphene grown on silicon carbide semiconductor
by 
Keskin, Yasemin, author.
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were done with Atomic Force Microscopy. The experimental results showed that single layer graphene on
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3 sonuç bulundu Arama sonuçlarına abone ol

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