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1. 
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing için kapak resmi
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing
by 
Bakali, Emine, author.
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parameters were analyzed by Scanning Electron Microscope (SEM), Atomic Force Microscope (AFM), Everson Etch
2. 
Characterization of defect structure of epitaxial CdTe films için kapak resmi
Characterization of defect structure of epitaxial CdTe films
Characterization of defect structure of epitaxial CdTe films
by 
Özden, Selin, author.
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on undoped 625≤25 μm thick GaAs(211)B wafers. The surfaces of GaAs wafers were investigated by Atomic
3. 
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry için kapak resmi
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
by 
Günnar, Merve, author.
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Alıntı: 
microscopy (AFM), Nomarski microscopy, Fourier transformation infrared spectroscopy (FTIR) and X-ray
4. 
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films için kapak resmi
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
by 
Bilgilisoy, Elif, author.
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layers were analyzed by atomic force microscopy (AFM), scanning electron microscopy (SEM) and Nomarski
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