by
Özden, Selin, author.
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El Yazması
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such as AFM, SEM, Nomarski Microscopy, X-ray Diffraction (XRD), Fourier Transform Infrared Spectroscopy
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Yüce, Hürriyet, author.
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El Yazması
Alıntı:
techniques such as Raman, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) and
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by
Yazıcı, Şebnem, author.
Format:
El Yazması
Alıntı:
phases, nearly pure CZTS thin films were obtained. Additionally, the intense and sharp XRD diffraction
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