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$Optical characterization of dielectric films on curved surfaces using diffraction method için kapak resmi$

Ekici, Çağın, author.

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Optical characterization of dielectric films on curved surfaces using diffraction method / Ekici

Kahyaoğlu, Tuğçe, Nefise, author.

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Electron Microscopy (SEM) and X-Ray Diffraction (XRD), respectively. It was shown that rod-like BaCO3

Gül, Dilek, author.

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, X-ray Diffraction (XRD), X-ray Fluorescence (XRF), Scanning Electron Microscopy (SEM), Thermogravimetric

Ulusoy, Seda, author.

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, crystalline structure of the targets was characterized by X-ray powder diffraction (XRPD) and Raman

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