by
Yavaş, Begüm, author.
Format:
El Yazması
Alıntı:
X-rays -- Diffraction.
by
Özden, Selin, author.
Format:
El Yazması
Alıntı:
such as AFM, SEM, Nomarski Microscopy, X-ray Diffraction (XRD), Fourier Transform Infrared Spectroscopy
View Other Search Results
by
Özçeri, Elif.
Format:
El Yazması
Alıntı:
roughness, which affected the number of graphene layers, were examined by X-ray Diffraction (XRD) and Atomic
Arama Sonuçlarını Sınırlandır
Daraltılmış: