Search Results for Electron spectroscopy.

Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing

Bakali, Emine, author.

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parameters were analyzed by Scanning Electron Microscope (SEM), Atomic Force Microscope (AFM), Everson Etch

Temperature dependence of resistivity and hall coefficient in Cu2ZnSnS4 absorbers for thin film solar cells

Akça, Fatime Gülşah, author.

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films were determined by scanning electron microscopy (SEM). Electrical properties were measured by van

Fabrication of ybco thin flims by pulsed laser deposiyion technique and their charcterization

Tozan, Şerife.

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problem by chaning distance between target and substrate, and laser power. Furthermore Electron Dispersive

Efficiency studies of Cu2ZnSnS2 thin film solar cell

Meriç, Ece, author

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X-Ray Diffraction (XRD) spectroscopies. Scanning electron microscopy (SEM) was used to investigate the

Characterization of vanadium oxide thin films grown by magnetron sputtering technique

Yüce, Hürriyet, author.

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at transition temperature was patterned by electron beam lithography in order to create FET channel

Growth and characterization of ZnSnO thin films on polymers for OLEDs

Ekmekçioğlu, Merve, author.

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spectroscopy (EDS), scanning electron microscopy (SEM), Xray diffraction (XRD) and Raman spectroscopy.

Magnetron sputtering growth of AZO/ZnO/Zn(O,S) multilayers for Cu2ZnSnS4 thin film solar cells: Material and device characterization

Köseoğlu, Fulya, author.

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investigated using energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), scanning electron

Ionic conductivity of Li0.5La0.5Ti1-xAlxO3 electrolytelayer for thin film batteries

Ulusoy, Seda, author.

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spectroscopy (XPS) respectively. Moreover, in order to understand the effect of Al doping on ionic conductivity

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