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1. 
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing için kapak resmi
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing
by 
Bakali, Emine, author.
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method, resonance Raman spectroscopy and Photoluminescence measurement. In our studies, dislocation
2. 
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry için kapak resmi
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
by 
Günnar, Merve, author.
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GaAs wafers by molecular beam epitaxy (MBE) were characterized by ex-situ spectroscopic ellipsometry
3. 
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films için kapak resmi
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
by 
Bilgilisoy, Elif, author.
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Alıntı: 
layers. CdTe epilayers which were grown on (211)B GaAs by molecular beam epitaxy (MBE) were subjected to
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