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Özden, Selin, author.
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Raman spectroscopy.
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Yüce, Hürriyet, author.
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techniques such as Raman, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) and
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Yazıcı, Şebnem, author.
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transmis-sion, and optical band gap have been determined to characterize CZTS thin films. Raman spectroscopy and
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