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2. 
The Growth of epitaxial graphene for two-dimensional electronics için kapak resmi
The Growth of epitaxial graphene for two-dimensional electronics
The Growth of epitaxial graphene for two-dimensional electronics
by 
İbrahim, Alnazir, author.
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to check the defects in the grown layer. At the wavelength of 514 nm , Raman spectroscopy is used to
3. 
Characterization of vanadium oxide thin films grown by magnetron sputtering technique için kapak resmi
Characterization of vanadium oxide thin films grown by magnetron sputtering technique
Characterization of vanadium oxide thin films grown by magnetron sputtering technique
by 
Yüce, Hürriyet, author.
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techniques such as Raman, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) and
4. 
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films için kapak resmi
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
by 
Bilgilisoy, Elif, author.
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etched samples were examined by Raman spectroscopy mapping. The “triangle” and “trapezoid” shaped etch
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4 sonuç bulundu Arama sonuçlarına abone ol

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