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Özkendir, Dilce, author.
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, Scanning Electron Microscopy and Atomic Force Microscopy measurements. The wrinkle to wrinkle spacing and
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by
Özçeri, Elif.
Format:
El Yazması
Alıntı:
measured from Surface Profiler and Scanning Electron Microscopy (SEM) images. Ni films were annealed at 800
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