76 sonuç bulundu Arama sonuçlarına abone ol
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Yazdır
by 
Şanlı, Keriman, author.
Format: 
El Yazması
Alıntı: 
X-ray Diffraction. Dielectric measurements were done to determine the phase transition temperatures
by 
Ülkeryıldız, Eda.
Format: 
El Yazması
Alıntı: 
Microscopy (SEM) for their morphology, and X-Ray diffraction (XRD) for their crystal structures. On the basis
by 
Şenöz, Ceylan
Format: 
El Yazması
Alıntı: 
FEG) equipped with EDS (Energy Dispersive Spectroscopy) unit, X-ray diffraction (XRD, Philips X.Pert
by 
Akça, Fatime Gülşah, author.
Format: 
El Yazması
Alıntı: 
tubular furnace in order to obtain the CZTS compound. X-ray diffraction and Raman spectroscopy
by 
Kahyaoğlu, Tuğçe, Nefise, author.
Format: 
El Yazması
Alıntı: 
Electron Microscopy (SEM) and X-Ray Diffraction (XRD), respectively. It was shown that rod-like BaCO3
by 
Özden, Selin, author.
Format: 
El Yazması
Alıntı: 
such as AFM, SEM, Nomarski Microscopy, X-ray Diffraction (XRD), Fourier Transform Infrared Spectroscopy
by 
Tozan, Şerife.
Format: 
El Yazması
Alıntı: 
) and x-ray diffraction measurements.Finally, our results were compared to literature and explanied
by 
Algül, Berrin Pınar.
Format: 
El Yazması
Alıntı: 
Diffraction.Prepared thin film samples were patterned as bicrystal grain boundary Josephson junctions by standard
by 
Ulucan, Savaş.
Format: 
El Yazması
Alıntı: 
Diffraction (XRD) method was used to obtain crystal structure of the grown films. To observe the surface
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76 sonuç bulundu Arama sonuçlarına abone ol
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