Search Results for Atomic force microscopy.

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Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing için kapak resmi
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry için kapak resmi
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
by 
Günnar, Merve, author.
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over the film surface. Characterization results were compared to those obtained by atomic force
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films için kapak resmi
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
by 
Bilgilisoy, Elif, author.
Access to Electronic Versiyon.
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El Yazması
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layers were analyzed by atomic force microscopy (AFM), scanning electron microscopy (SEM) and Nomarski
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