by
Şenöz, Ceylan
Format:
El Yazması
Alıntı:
FEG) equipped with EDS (Energy Dispersive Spectroscopy) unit, X-ray diffraction (XRD, Philips X.Pert
by
Ünal, Uğur.
Format:
El Yazması
Alıntı:
Spectrophotometer (FTIR), Thermogravimetric Analyzer (TGA), Scanning Electron Microscope (SEM), X-Ray Diffraction
by
Karşal, Çiçek.
Format:
El Yazması
Alıntı:
by melt blending method. The experimental results of X-ray diffraction (XRD) and scanning electron
by
Urkaç Sokullu, Şadiye Emel.
Format:
El Yazması
Alıntı:
), Differential Scanning Calorimetry (DSC), X-Ray Diffraction (XRD) Analysis, Atomic Force Microscopy (AFM
by
Büyükkebabçı, Hande.
Format:
El Yazması
Alıntı:
Electron Microscopy (SEM) and Xray Diffraction (XRD) were used to investigate the samples to check for the
by
Bozkurt, Suat Bahar.
Format:
El Yazması
Alıntı:
heat treatment. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques were used for
by
Onmuş, Ortaç.
Format:
El Yazması
Alıntı:
incidence x-ray diffraction (XRD and GIXRD), conversion electron and x-ray Mössbauer spectroscopies (CEMS
by
Türkan, Uğur.
Format:
El Yazması
Alıntı:
x-ray diffraction (XRD and GIXRD) and cross-sectional scanning electron microscopy (SEM). Metal ion