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Ekici, Çağın, author.
Format: 
El Yazması
Alıntı: 
Optical characterization of dielectric films on curved surfaces using diffraction method / Ekici
by 
Akın, Osman.
Format: 
El Yazması
Alıntı: 
All Optical Switching Via Diffraction Grating Formed By Interference of Gaussian Beams/ Akın, Osman.
by 
Kavalcı, Sedat.
Format: 
El Yazması
Alıntı: 
Keywords: Anorthite, boric acid, colemanite, statistical experimental design, X ray diffraction.
by 
Eltepe, Hüdal Emre.
Format: 
El Yazması
Alıntı: 
X-Ray diffraction, Fourier Transform Infrared Spectroscopy (FTIR), Scanning Electron Microscopy (SEM
by 
Kızıltepe, Esin, author.
Format: 
El Yazması
Alıntı: 
by means of Scanning Electron Microscopy (SEM) and X-Ray Diffraction (XRD). The PE and PP were
by 
Arpacıoğlu, Merve, author.
Format: 
El Yazması
Alıntı: 
methods such as single crystal X-ray diffraction (SCXRD), powder X-ray diffraction (PXRD
by 
Kaya, Birnur, author.
Format: 
El Yazması
Alıntı: 
molecular configurations. In addition to these, X-Ray diffraction spectra of quaternary ZnCdSSe nanoalloys
by 
Günel, Hacı Yusuf.
Format: 
El Yazması
Alıntı: 
, LaAlO3 and SrTiO3 substrates were first characterized structurally via x-ray diffraction and scanning
by 
Çağatay, Filiz.
Format: 
El Yazması
Alıntı: 
diffraction of water waves and addition theorem for bessel functions. The linear boundary value problem which