by
Yazıcı, Şebnem, author.
Format:
El Yazması
Alıntı:
Thin films.
by
Arslan, Halil, author.
Format:
El Yazması
Alıntı:
structural characterization of thin films was carried out by means of optical microscope and scanning
by
Yüce, Hürriyet, author.
Format:
El Yazması
Alıntı:
Characterization of vanadium oxide thin films grown by magnetron sputtering technique / Yüce