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Author: Selamet, Yusuf thesis advisor.
Author
Dahil
Hariç
İzmir Institute of Technology. Physics.
(3)
Bakali, Emine, author.
(1)
Bilgilisoy, Elif, author.
(1)
Günnar, Merve, author.
(1)
Polat, Mustafa, author.
(1)
Özden, Selin, author.
(1)
İzmir Institute of Technology. Physics.
(1)
İzmir Institute of Technology. Physics.
(1)
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Material Type
Dahil
Hariç
Ek CD-ROM
Tez
Language
Dahil
Hariç
English
(5)
Publication Date
Dahil
Hariç
-
2014
(3)
2015
(2)
Subject
Dahil
Hariç
Molecular beam epitaxy.
(2)
Raman spectroscopy.
(2)
Atomic force microscopy.
(1)
Cadmium telluride.
(1)
Ellipsometry.
(1)
Epitaxy.
(1)
Gallium arsenide semiconductors -- Testing
(1)
Mercury cadmium tellurides.
(1)
Molecular beam epitaxy
(1)
Scanning electron microscopy.
(1)
Simulated annealing (Mathematics)
(1)
Thin films.
(1)
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Dahil
Hariç
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1.
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
Characterization of lattice mismatch indüced dislocations on epitaxial CdTe films
by
Bilgilisoy, Elif, author.
Access to Electronic Versiyon.
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2.
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing
Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing
by
Bakali, Emine, author.
Access to Electronic Versiyon.
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3.
Characterization of defect structure of epitaxial CdTe films
Characterization of defect structure of epitaxial CdTe films
by
Özden, Selin, author.
Access to Electronic Versiyon.
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4.
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
Characterization of molecular beam epitaxially crown CdTe layers over gass by spectroscopic ellipsometry
by
Günnar, Merve, author.
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5.
Characterization of GaAs (211) surface for epitaxial buffer growth
Characterization of GaAs (211) surface for epitaxial buffer growth
by
Polat, Mustafa, author.
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