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Tez Koleksiyonu

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Subject: Atomic force microscopy.

Author

İzmir Institute of Technology. Chemical Engineering.

(4)

Balantekin, Müjdat, thesis advisor.

(2)

Polat, Mehmet. Thesis advisor.

(2)

İzmir Institute of Technology. Electronics and Communication Engineering.

(2)

Ateş, Serkan, thesis advisor.

(1)

Bakali, Emine, author.

(1)

Balköse, Devrim. Thesis advisor.

(1)

Brar, Harpreet Singh, author.

(1)

Bölükçü, Elif Şeniz.

(1)

Büyükköse, Serkan.

(1)

Coşar, Alper, author.

(1)

Güler, Ayşe.

(1)

Kılıç Özdemir, Sevgi. Thesis advisor.

(1)

Kızılkaya, Ali Can, thesis advisor.

(1)

Okur, Salih. Thesis advisor.

(1)

Selamet, Yusuf thesis advisor.

(1)

Yavaş, Begüm, author.

(1)

Yelken Özek, Gülnihal.

(1)

Yetgin, Senem.

(1)

Yıldırım, Koray, author.

(1)

Çelebi, Cem thesis advisor.

(1)

Özkendir, Dilce, author.

(1)

İzmir Institute of Technology. Materials Science and Engineering.

(1)

İzmir Institute of Technology. Physics.

(1)

İzmir Institute of Technology. Material Science and Engineering.

(1)

İzmir Institute of Technology. Chemical Engineering.

(1)

İzmir Institute of Technology. Physics.

(1)

Material Type

Language

(11)

Publication Date

(2)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

Subject

(3)

(3)

Molecular beam epitaxy.

(2)

Surface chemistry.

(2)

Adsorption.

(1)

Aluminum oxide.

(1)

Chemical vapor deposition.

(1)

DNA.

(1)

Electrical engineering.

(1)

Ellipsometry.

(1)

Extraction (Chemistry).

(1)

Frequency response (Electrical engineering).

(1)

Graphene.

(1)

Hydroxyapatite.

(1)

Imaging systems in genetics.

(1)

Impedance spectroscopy.

(1)

Intermolecular forces.

(1)

Liquids.

(1)

Microbubbles.

(1)

Oxidation.

(1)

Scanning electron microscopes.

(1)

Scanning electron microscopy.

(1)

Scanning probe microscopy.

(1)

Semiconductor-metal boundaries.

(1)

Semiconductors.

(1)

Silica.

(1)

Silicon oxide.

(1)

Simulated annealing (Mathematics)

(1)

Solid-phase biochemistry.

(1)

Solids -- Surfaces

(1)

Surfaces (Technology) -- Analysis.

(1)

Surfaces(Physics)

(1)

Thin films, Multilayered.

(1)

Tinplate.

(1)

Ultrasonic imaging.

(1)

X-rays -- Diffraction.

(1)

(1)

Library

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Effect of aging electrolyte and organic coating type on the corrosion mechanism of tinplate

Yıldırım, Koray, author.

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Analysis of cantilevers for high-speed atomic force microscopy

Brar, Harpreet Singh, author.

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Nonlinear controller design for high speed dynamic atomic force microscope system

Coşar, Alper, author.

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Self-organized network of silicon oxide on epitaxial graphene

Özkendir, Dilce, author.

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Molecular beam epitaxial growth of ZnSe on (211)B GaAs

Yavaş, Begüm, author.

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Defect reduction study of molecular beam epitaxially grown CdTe thin flims by ex-situ annealing

Bakali, Emine, author.

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Dna adsorption on sılıca, alumına and hydroxyapatite and imaging of dna by atomic force microscopy

Yetgin, Senem.

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Determining charge distribution of metal oxide surfaces with afm using colloid probe technique

Güler, Ayşe.

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Design and characterization of shell structure of microbubbles used in ultrasound imaging

Bölükçü, Elif Şeniz.

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10.

Estimation of the surface charge distribution of solids in liquids by using atomic force microscopy

Yelken Özek, Gülnihal.

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11.

Electrical surface modification and characterization of metallic thin films using scanning probe microscope (SPM) nanolithography method

Büyükköse, Serkan.

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