Arama Sonuçlarını Sınırlandır
75 sonuç bulundu
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Ataç, Enes, author.
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diffraction method / Ataç, Enes, author.
by
Ekici, Çağın, author.
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Optical characterization of dielectric films on curved surfaces using diffraction method / Ekici
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Akın, Osman.
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All Optical Switching Via Diffraction Grating Formed By Interference of Gaussian Beams/ Akın, Osman.
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Demirkol, İrem, author.
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by X-ray diffraction (XRD) and surface morphologies of coated pellets by scanning electron
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Kurtuldu, Seher Hazal, author.
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-ray diffraction (XRD), scanning electron microscopy (SEM), spectrophotometry and Raman spectroscopy. Structural
by
Tokkan, Melike, author.
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of all materials done using X-ray Diffraction method. Fourier Transform Infrared Spectroscopy was
by
Bıyıklı, Ozan, author.
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(SEM), X-Ray diffraction (XRD), and current-voltage measurement. Furthermore, n-i-p devices with the
by
Uyanık, Zemzem, author.
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films have been characterized as a function of annealing temperature by X-ray diffraction (XRD
by
Kaya, Birnur, author.
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molecular configurations. In addition to these, X-Ray diffraction spectra of quaternary ZnCdSSe nanoalloys
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Serkir, Sevgi, author.
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micro-structures of samples were analysed by scanning electron microscopy and the X-ray diffraction
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İlhan, Hatice, author.
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hydrothermal method. Characterization of the synthesized material was carried out by using X-ray diffraction, X
by
Arpacıoğlu, Merve, author.
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such as single crystal X-ray diffraction (SCXRD), powder X-ray diffraction (PXRD), Fourier
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