by
Mendirek, Gizem, author.
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molecules. Spectroscopic Ellipsometry (SE) was used to measure the monolayer thickness. Contact Angle
by
Bilgilisoy, Elif, author.
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were measured by ex-situ spectroscopic ellipsometry (SE). The surface morphologies of the CdTe buffer
by
Günnar, Merve, author.
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ellipsometry / Günnar, Merve, author.
by
Oğuz, Kaan.
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Diffraction (XRD), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM). Ellipsometry was
by
Yavaş, Begüm, author.
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Ellipsometry.
by
Tokuç, Hüseyin.
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. Refractive index of the barrier layer was determined by ellipsometry technique. In this study, magnetic